周維列博士,1993年畢業(yè)于中國科學(xué)院物理研究所。1994一1997年先后在日本精密陶瓷材料研究所(JFCC)和美國凱斯西部保留大學(xué)(CWRU)從事電子顯微學(xué)博士后研究。1998年至今任美國新奧爾良大學(xué)(LJNO)先端材料研究所(AMRI)電鏡室主任。從事電子顯微鏡在材料中的應(yīng)用近20年,獲美國自然科學(xué)基金(NSF)和美國國防部先端研究項(xiàng)目(DARPA)等多項(xiàng)資助?,F(xiàn)為美國電子顯微學(xué)會(huì)和材料學(xué)會(huì)會(huì)員。王中林博士,美國佐治亞理工學(xué)院(Georgia Institute of TechnoIogy)終身教授、校董事講席教授(Regents’Professor)、納米結(jié)構(gòu)表征和器件制造中心主任,中國國家納米科學(xué)中心海外主任,美國物理學(xué)會(huì)資深會(huì)員(Fellow)。榮獲美國顯微鏡學(xué)會(huì)1999年巴頓獎(jiǎng)?wù)?,佐治亞理工學(xué)院2000年和2005年杰出研究獎(jiǎng),2005年Sigma Xi學(xué)會(huì)持續(xù)研究獎(jiǎng),2001年S.T.Li獎(jiǎng)金(美國化學(xué)學(xué)會(huì)),美國自然科學(xué)基金會(huì)CAREER基金。他是1992:2002年10年中納米科技論文引用次數(shù)世界個(gè)人排名前25位作者之一,其學(xué)術(shù)論文已被引用10000次以上。
圖書目錄
Chapter 1 Fundamentals of Scanning Electron Microscopy 1.1 Introduction 1.2 Configuration of scanning electron microscopes 1.3 Specimen preparation 1.4 Conclusion References Chapter 2 Electron Backscatter Diffraction(EBSD)Technique and Materials Characterization Examples 2.1 Introduction 2.2 Data measurement 2.3 Data analysis 2.4 Applications 2.5 Current limitations and fur 2.6 Conclusion References Chapter 3 X-ray Microanalysis in Nanomaterials 3.1 Introduction 3.2 Monte Carlo modeling of nanomaterials 3.3 Case studies 3.4 Conclusion References Chapter 4 Low kV Scanning Electron Microscopy 4.1 IntrOductlon 4.2 Electron generation and accelerating voltage 4.3 Why use low kV? 4.4 Using low kV 4.5 Conclusion References Chapter 5 E-beam Nanolithography Integrated with Scanning Electron Microscope 5.1 Introduction 5.2 Materials and processing preparation 5.3 Pattern generation 5.4 Pattern processing 5.5 Applications 5.6 Conclusion References Chapter 6 Scanning Transmission Electron Microscopy for Nanostructure Characterization 6.1 Introduction 6.2 Imaging in the STEM 6.3 Spectroscopic imaging 6.4 Three-dimensional imaging 6.5 Recent applications to nanostructure characterization 6.6 Future directions References Chapter 7 Introduction to ln-situ Nanomanipulation for Nanomaterials Engineering 7.1 Introduction 7.2 SEM Contamination 7.3 Types of nanomanipulators 7.4 End effectors 7.5 Applications of nanomanipulators 7.6 Conclusion References Chapter 8 Applications of FIB and DualBeam for Nanofabrication 8.1 Introductlon 8.2 Onboard digital patterning with the ion beam 8.3 FIB milling or CVD deposition with bitmap files 8.4 Onboard digital patterning with the electron beam 8.5 Automation for nanometer control 8.6 Direct fabrication of nanoscale structures 8.7 Conclusion References Chapter 9 Nanowires and Carbon Nanotubes 9.1 Introduction 9.2 Ⅲ-V compound semiconductors nanowires 9.3 Ⅱ-VI compound semiconductors nanowires 9.4 Elemental nanowires 9.5 Carbon nanotubes 9.6 Conclusion References Chapter 10 Photonic Crystals and Devices 10.1 Introduction 10.2 SEM imaging of photonic crystals 10.3 Fabrication of photonic crystals in SEM 10.4 Conclusion References Chapter 11 Nanoparticles and Colloidal Self-assembly 11.1 Introduction 11.2 Metallic nanoparticles 11.3 Mesoporous and nanoporous metal nanostructures 11.4 Nanocrvstalline oxides 11.5 Nanostructured semiconductor and thermoelectric materials 11.6 Conclusion References Chapter 12 Nano-building Blocks Fabricated through Templates 12.1 Introduction 12.2 Materials and methods 12.3 Nano-building blocks 12.4 Conclusion References Chapter 13 One-dimensional Wurtzite Semiconducting Nanostructures 13.1 Introduction 13.2 Synthesis and fabrication of one—dimensional nanostructures 13.3 One-dimensional metal oxide nanostructures 13.4 Growth mechanisms 13.5 Conclusion References Chapter 14 Bio-inspired Nanomaterials 14.1 Introduction 14.2 Nanofibers 14.3 Nanoparticles 14.4 Surface modification 14.5 Conclusion References Chapter 15 Cryo-Temperature Stages in Nanostructural Research 15.1 Introduction 15.2 Terminology used in cryo-HRSEM of aqueous systems 15.3 Liquid water,ice,and vitrified water 15.4 History of 10W temperature SEM 15.5 Instrumentation and methods References